ISSN:
0887-6266
Keywords:
thermal expansion
;
thin films
;
ellipsometer
;
glass transition
;
refractive index
;
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Chemistry and Pharmacology
,
Physics
Notes:
The glass transition (Tg) of thin polystyrene films (ca. 3000 A˚) cast on silicon wafers was determined by a new technique. An ellipsometer was used to determine the refractive index and thickness of the polystyrene films. Tg was determined by measuring the temperature dependence of the refractive index. The change in thickness with temperature was used to calculate the linear and bulk thermal expansion coefficients of the material. A significant shift in Tg, possibly due to strains induced in the cooled films, was observed between heating and cooling for polystyrene films. © 1993 John Wiley & Sons, Inc.
Additional Material:
8 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/polb.1993.090310310
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