ISSN:
1572-9605
Keywords:
Single crystal of Bi2Sr2CaCu2O8
;
high-resolution electron microscopy
;
low-temperature electron diffraction
;
lattice anomaly
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract High-resolution electron microscopy of a Bi2Sr2CaCu2O8 (Bi2212) single crystal prepared by the floating zone method shows that the single crystal is of high quality; there is no intergrowth faulting in the layered structure along the c-axis. Low-temperature selected area diffraction and convergent beam electron diffraction (CBED) studies of this high-quality single crystal show that there is no detectable change for both the point group symmetry of the basic structure and the modulated structure from room temperature to about 15 K. However, a lattice anomaly around 215 K was suggested by measuring the temperature dependence of the ratio between the cross-point distances of the HOLZ lines in high-index CBED patterns. The presence of the lattice anomaly was further confirmed by low-temperature X-ray diffraction.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1022658413633
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