ISSN:
1573-2746
Keywords:
grain boundaries
;
interfaces
;
sapphire
;
intermediate layers
;
HREM
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract The structure of the artificial grain boundaries in Al2O3 bicrystals withY3Al5O12 and Y-stabilizedZrO2 (Y-ZrO2) intermediate layers was studiedwith high resolution electron microscopy, electron diffraction and energydispersive X-ray analysis. TheY3Al5O12 intermediate layer wasfound to be polycrystalline with three different orientation relationshipsbetween the 2O3 and theY3Al5O12. The structure of theY3Al5O12/2O3 interfaces is described.Also2O3 bicrystals with an Y-ZrO2/2O3/Y-ZrO2/2O3/Y-ZrO2intermediate layer, prepared at two different temperatures, werestudied.Recry stallization of the intermediate layers occurred during thesolid phase intergrowth of the 2O3 bicrystalsparts and only an Y-ZrO2 layer was found as intermediatelayer. The misorientation between the consecutive Y-ZrO2grains was less than 1.5°. Misfit dislocations and atomic height stepsdecorate the Y-ZrO2/2O3interface.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1008659703586
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