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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Plasma chemistry and plasma processing 20 (2000), S. 65-86 
    ISSN: 1572-8986
    Keywords: thermal plasma ; waste processing ; fly-ash vitrification ; optical emission spectroscopy ; volatilization ; lead ; modeling
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Technology
    Notes: Abstract Results are presented of optical emission spectroscopy (OES) application asa control tool to improve fly-ash plasma vitrification. A twin-torch plasmasystem has been used for the fly-ash processing, and a new OES method hasexamined metallic vapors above the melt. The method allows the study ofnonhomogeneous optically thin plasmas exhibiting a symmetry plane withoutsophisticated tomographic systems. The dc arc torches are mounted above acold crucible filled with a synthetic glass. The arc intensity is from200 to 400 Å. Argon is introduced into the torches along the cathodeand the anode, while argon, oxygen or hydrogen are injected through thelance between the torches. Local plasma temperatures above the melt havebeen evaluated using measured relative intensities of spectral lines ofthe plasma-forming gas. Metallic vapor concentration in the plasma isdeduced from the intensity ratio of the metal–gas spectral lines. Leadoxide has been used to study heavy-metal behavior at the fly-ash plasmavitrification. Distribution of the lead along the crucible surface,depending on the plasma-forming gas composition as well as the concentrationevolution with time, have been examined. The elemental analysis of theresultant glass has been measured by scanning electron microscopy (SEM)with energy-dispersive spectrometry (EDS). A predictive model has beenadapted to simulate the noncongruent vaporization of heavy metals from themelt. According to the data obtained, steep variations of the volatility ofthe elements depend strongly on reducing properties of gases controllingthe plasma composition near the melted surface. In addition, the melttemperature and the redox potential of the gas phase are found to be themost critical parameters.
    Type of Medium: Electronic Resource
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