ISSN:
1572-879X
Schlagwort(e):
ellipsometry
;
methane
;
palladium
;
palladium oxide
;
oscillations
Quelle:
Springer Online Journal Archives 1860-2000
Thema:
Chemie und Pharmazie
Notizen:
Abstract Ellipsometry is used to follow the growth of a PdO layer on the surface of a thick Pd-film catalyst during methane oxidation at ∼ 500°C. The oxide layer that develops under rich conditions (excess CH4) is quite porous and roughens with time. Little CO is formed during this period, but the CO2 formation rate increases until spontaneous oscillations develop, which correlate with changes in the ellipsometric data. These changes indicate that the porous oxide rapidly converts to a metal-rich state, which has decreased catalytic activity, and then slowly reoxidizes.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1007/BF00807112
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