ISSN:
1662-9752
Quelle:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Thema:
Maschinenbau
Notizen:
In response to the development of new materials and the application of materials andcomponents in new technologies the direct measurement, calculation and evaluation of textures andresidual stresses has gained worldwide significance in recent years. Non-destructive analysis forphase specific residual stresses and textures is only possible by means of diffraction methods. Inorder to cater for the development of these analytical techniques the new Materials ScienceDiffractometer STRESS-SPEC at FRM-II is designed to be equally applied to texture and residualstress analyses by virtue of its flexible configuration. The system compromises a highly flexiblemonochromator setup using three different monochromators: Ge (511), bent silicon (400) andpyrolitic graphite (PG). This range of monochromators and the possibility to vary the take-off anglesfrom 2θM = 35º to 110º allows wavelength adjustment such that measurements can be performedaround a scattering angle of 2θS ~ 90º. This is important in order to optimise neutron flux andresolution, especially for stress analysis on components, since the gauge volume element in that caseis cubic and large vertical divergences due to focusing monochromators do not affect the spatialresolution.The instrument is now available for routine operation and here we will present details of recentexperiments and instrument performance
Materialart:
Digitale Medien
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/13/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.211.pdf
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