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  • 1
    Publikationsdatum: 2020-03-09
    Sprache: Englisch
    Materialart: conferenceobject , doc-type:conferenceObject
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  • 2
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    Publikationsdatum: 2020-02-14
    Sprache: Englisch
    Materialart: conferenceobject , doc-type:conferenceObject
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  • 3
    Publikationsdatum: 2020-03-09
    Sprache: Englisch
    Materialart: article , doc-type:article
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  • 4
    Publikationsdatum: 2020-02-14
    Sprache: Englisch
    Materialart: article , doc-type:article
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  • 5
    Publikationsdatum: 2020-02-14
    Sprache: Englisch
    Materialart: conferenceobject , doc-type:conferenceObject
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  • 6
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 2403-2407 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The luminescence properties of 3 μm thick, strongly emitting, and highly porous silicon films were studied using a combination of photoluminescence, transmission electron microscopy, and Fourier transform infrared spectroscopy. Transmission electron micrographs indicate that these samples have structures of predominantly 6–7 nm size clusters (instead of the postulated columns). In the as-prepared films, there is a significant concentration of Si—H bonds which is gradually replaced by Si—O bonds during prolonged aging in air. Upon optical excitation these films exhibit strong visible emission peaking at ≈690 nm. The excitation edge is shown to be emission wavelength dependent, revealing the inhomogeneous nature of both the initially photoexcited and luminescing species. The photoluminescence decay profiles observed are highly nonexponential and decrease with increasing emission energy. The 1/e times observed typically range from 1 to 50 μs. The correlation of the spectral and structural information suggests that the source of the large blue shift of the visible emission compared to the bulk Si band gap energy is likely to be due to quantum confinement in the nanometer size Si clusters. The electron-hole recombination process, on the other hand, remains unclear.
    Materialart: Digitale Medien
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  • 7
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 3223-3228 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Best-case evaluations are made for potential optoelectronic applications of erbium-doped silicon (EDS). The objective is to find the upper limit of performance when EDS is used as light-emitting diodes, amplifiers/modulators, and lasers. Every effort is made to use intrinsic parameters whose values are determined by physics rather than by factors such as material quality and processing quality. Consequently, the result is expected to be overly optimistic, and should be regarded as a feasibility study only. It is shown that Er-doped Si is not suitable for light-emitting-diode applications because of the low emitted power (microwatts). The intensity amplifiers/modulators made of Er-doped Si can only be expected to provide a very modest gain (〈6 cm−1). For laser applications, the threshold population inversion can be achieved in principle (assuming proper design and processing of the laser structure); however, a very efficient pumping mechanism is necessary for the laser to provide reasonable power output (of the order of mW/facet). Finally, a view on the direction of future research in this field is presented. Since the rare-earth ion luminescence is known to be fairly independent of the host materials, the results obtained from this study are expected to be applicable to most of the other rare-earth-doped semiconductors.
    Materialart: Digitale Medien
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  • 8
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 8364-8370 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: A procedure for the fabrication of two-dimensional carrier (electron and hole) gases in modulation doped GeSi/Si heterostructures is presented. The best 4.2 K mobilities measured for the two-dimensional electron and hole gases are 180 000 cm2/V s and 18 000 cm2/V s, respectively. Recently, two-dimensional hole gases with mobilities as high as 55 000 cm2/V s have been obtained. The carrier gases are fabricated on top of relaxed, compositionally graded GexSi1−x buffer layers with low threading dislocation densities (≈106 cm−2). Experimental evidence indicates that the function of the graded buffer is to promote dislocation propagation while suppressing nucleation. A comparative analysis is carried out for two dimensional electron gases in GeSi/Si/GeSi and in AlGaAs/GaAs structures. Although molecular beam epitaxy is used to grow the samples, the principle discussed here is independent of growth technique.
    Materialart: Digitale Medien
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  • 9
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Photoluminescence (PL) spectroscopy, cathodoluminescence (CL) spectroscopy and imaging, and preferential defect etching and optical microscopy have been used to characterize compositionally graded Si1−xGex alloy layers grown by molecular beam epitaxy. Si1−xGex capping layers grown on the compositionally graded layers have low threading dislocation densities, and both PL and low-beam energy CL spectra show bound exciton luminescence features identical with those observed in bulk Si1−xGex alloys and relatively weak dislocation related D-band features. Increasing the beam energy increases the relative strength of the D bands in the CL spectra, indicating that they are associated with the misfit dislocations in the compositionally graded layer. This has been confirmed by combined chemical etching and PL spectroscopy measurements. The misfit dislocations can be observed by monochromatic CL imaging at a high-beam energy using a narrow band pass filter centerd on the D4 band.
    Materialart: Digitale Medien
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  • 10
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 2667-2671 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: A detailed study of the electrical and defect properties of ion-implanted erbium in silicon shows that erbium doping introduces donor states. The concentration of erbium related donors as a function of implant dose saturates at 4×1016 cm−3 at a peak implanted Er-ion concentration of (4–7)×1017 cm−3. The defect levels related to erbium in silicon are characterized by deep level transient spectroscopy and identified as E(0.09), E(0.06), E(0.14), E(0.18), E(0.27), E(0.31), E(0.32), and E(0.48). The dependence of the photoluminescence on annealing temperature for float zone and for Czochralski-grown silicon show that oxygen and lattice defects can enhance the luminescence at 1.54 μm from the erbium. Temperature-dependent capacitance-voltage profiling shows donor emission steps when the Fermi level crosses EC − ET = 0.06 eV and EC − ET = 0.16 eV.
    Materialart: Digitale Medien
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