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Digitale Medien

1/f noise of Bi2Sr2CaCu2Oy intrinsic Josephson junctions (2001)

Saito, A. ; Hamasaki, K.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 90 (2001), S. 2911-2914

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Details

ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: We have measured the low-frequency voltage noise properties across mesa stacks of intrinsic Josephson junctions in Bi2Sr2CaCu2Oy (BSCCO) single crystals as a function of bias voltage. The BSCCO mesas with area of 160×40 μm2 were fabricated on the surface of cleaved BSCCO single crystals using standard photolithography and Ar ion-milling techniques. The measured noise voltage spectrum density SV(f ) had a 1/f dependence on frequency. The magnitude of the 1/f noise spectra was found to increase monotonically with the branch number in the I–V characteristic at fixed bias current, and no anomalously enhanced 1/f noise was observed. © 2001 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1381048

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