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Dependence of the K X-ray yield on target thickness in the S + Ge collision system (1986)

Bǎdicǎ, T. ; Ciortea, C. ; Popescu, I.

New York, NY [u.a.] : Wiley-Blackwell

X-Ray Spectrometry 15 (1986), S. 107-109

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Details

ISSN: 0049-8246

Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy

Quelle: Wiley InterScience Backfile Collection 1832-2000

Thema: Physik

Notizen: Measurements of the target-thickness dependence of the target K x-ray production yields are reported for 1 and 2 MeV/amu Sq+ (q = 6 and 8) ions incident upon thin solid targets of Ge. Target K x-ray production cross-sections were extracted in the limit of vanishing target thickness. Comparisons of the data with theoretical estimates based on combinations of direct ionization and electron-transfer processes are presented.

Zusätzliches Material: 1 Ill.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1002/xrs.1300150207

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