ZIB

1

Electronic Resource

Reply to "Comment on ‘A theory on the x-ray sensitivity of a silicon surface-barrier detector including a thermal charge-diffusion effect' '' [J. Appl. Phys. 72, 3363 (1992)] (1993)

Cho, T. ; Hirata, M. ; Takahashi, E. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 74 (1993), S. 1463-1464

add to mindlist on the mindlist

Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The effect of thermal-diffusion charge on the x-ray energy response of silicon surface-barrier (SSB) detectors have generally been ignored; consequently, the SSB response has been believed to be analyzed using the thickness of the depletion layer alone. Our new theory on the SSB x-ray response [J. Appl. Phys. 72, 3363 (1992)] was prepared for addressing recent confusion on plasma x-ray analyses using SSB detectors [Rev. Sci. Instrum. 59, 1380 (1988); 61, 693 (1990); 63, 4850 (1992)]. This approach was made under the assumption of a dominant contribution of the diffusion-charge signal in the vicinity of the x-ray incident location because of the strong reduction of the x-ray produced charge within the thermal-diffusion length. In this report, the comparison between this approximation (having an approximated solution) and the exact numerical calculation (using an integral form) is carried out. Necessity and importance of such three-dimensional treatments for the data analyses as well as the design of multichannel semiconductor-array detectors developed for plasma x-ray tomography diagnostics are highlighted. Furthermore, for the total diffusing-charge amount, the calculated results from our theory and the values using the comment from Donolato agree well within the accuracy of 1%.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.354864

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

2

Electronic Resource

A theory on the x-ray sensitivity of a silicon surface-barrier detector including a thermal charge-diffusion effect (1992)

Cho, T. ; Hirata, M. ; Takahashi, E. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 72 (1992), S. 3363-3373

add to mindlist on the mindlist

Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: An analytical method based on a new theoretical model for the x-ray energy responses of silicon surface-barrier (SSB) detectors has been proposed. This method may address a recent confusing issue in the x-ray detection characteristics of SSB semiconductor detectors; that is, the x-ray responses of SSB detectors as well as p-i-n diodes used in underbiased operations were recently found to be contrary to the commonly held belief that the x-ray sensitivity of an SSB detector is determined by the thickness of the depletion layer. The model presented includes a signal contribution from thermally diffusing charge that is created in the field-free substrate region within a diffusion length from the depletion layer along with a signal contribution from charge created in the depletion layer. This model predicts a large signal contribution from the charge-diffusion effect on the SSB responses to high-energy x rays. Formulas and calculated results supporting SSB calibration data have been represented. These analytical methods might be developed to apply the analyses and predictions of energy responses of various types of silicon detectors including p-i-n diodes as well as charge-coupled devices.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.351458

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

3

Electronic Resource

Linear analysis of a finite length plasma-filled backward wave oscillator (1992)

Ali, M. M. ; Ogura, K. ; Minami, K. ; [et al.]

New York, NY : American Institute of Physics (AIP)

Physics of Fluids 4 (1992), S. 1023-1032

add to mindlist on the mindlist

Details

ISSN: 1089-7666

Source: AIP Digital Archive

Topics: Physics

Notes: Absolute instability in a plasma-filled backward wave oscillator with sinusoidally corrugated slow wave structure driven by an intense relativistic electron beam has been analyzed numerically. The maximum spatial growth rate of the plasma-filled waveguide is found to be larger than that of an optimally designed vacuum structure. The excitation of a finite length structure is investigated. Although the spatial growth rates obtained in the linear theory increase with plasma density in the finite length plasma-filled structure for the fundamental TM01 mode of oscillation, negative global spatial growth rates prevent the coherent oscillation for intermediate ranges of plasma density, beam current, and even for structure length.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.860225

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

4

Electronic Resource

Search for GUTs monopoles with track-etch detectors

Ogura, K. ; Orito, S. ; Nakamura, S. ; [et al.]

Amsterdam : Elsevier

International Journal of Radiation Applications & Instrumentation. Part D, 16 (1989), S. 107-114

add to mindlist on the mindlist

Details

ISSN: 1359-0189

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1016/1359-0189(89)90041-1

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

5

Electronic Resource

Effects of pre-soaking on characteristics of CR-39

Ogura, K.

Amsterdam : Elsevier

International Journal of Radiation Applications & Instrumentation. Part D, 19 (1991), S. 197-202

add to mindlist on the mindlist

Details

ISSN: 1359-0189

Keywords: CR-39 ; etched-surface quality ; hydrolysis ; pre-soaking ; sensitivity enhancement

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Type of Medium: Electronic Resource

URL: http://linkinghub.elsevier.com/retrieve/pii/1359-0189(91)90172-E

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

6

Electronic Resource

Standard method for measurement of bulk etch in CR-39

Henke, R. ; Ogura, K. ; Benton, E.V.

Amsterdam : Elsevier

International Journal of Radiation Applications & Instrumentation. Part D, 12 (1986), S. 307-310

add to mindlist on the mindlist

Details

ISSN: 1359-0189

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Type of Medium: Electronic Resource

URL: http://linkinghub.elsevier.com/retrieve/pii/1359-0189(86)90595-9

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

7

Electronic Resource

Proton response of CR-39

Ogura, K. ; Benton, E.V. ; Frank, A. ; [et al.]

Amsterdam : Elsevier

International Journal of Radiation Applications & Instrumentation. Part D, 12 (1986), S. 527-530

add to mindlist on the mindlist

Details

ISSN: 1359-0189

Keywords: CR-39 ; antioxidant ; proton response ; track diameter distribution ; track recording properties

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Type of Medium: Electronic Resource

URL: http://linkinghub.elsevier.com/retrieve/pii/1359-0189(86)90645-X

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

8

Electronic Resource

Improvements of CR-39 for massive magnetic monopoles search

Ogura, K. ; Doke, T. ; Ichinose, H. ; [et al.]

Amsterdam : Elsevier

International Journal of Radiation Applications & Instrumentation. Part D, 15 (1988), S. 315-318

add to mindlist on the mindlist

Details

ISSN: 1359-0189

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Type of Medium: Electronic Resource

URL: http://linkinghub.elsevier.com/retrieve/pii/1359-0189(88)90156-2

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

9

Electronic Resource

Response of different types of CR-39 to energetic ions

Benton, E.V. ; Ogura, K. ; Frank, A.L. ; [et al.]

Amsterdam : Elsevier

International Journal of Radiation Applications & Instrumentation. Part D, 12 (1986), S. 79-82

add to mindlist on the mindlist

Details

ISSN: 1359-0189

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Type of Medium: Electronic Resource

URL: http://linkinghub.elsevier.com/retrieve/pii/1359-0189(86)90542-X

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

10

Electronic Resource

Fading of latent tracks in CR-39 due to environmental conditions

Frank, A.L. ; Ogura, K. ; Benton, E.V.

Amsterdam : Elsevier

International Journal of Radiation Applications & Instrumentation. Part D, 12 (1986), S. 83-86

add to mindlist on the mindlist

Details

ISSN: 1359-0189

Keywords: CR-39 ; annealing environment ; anti-oxidant ; fading of latent tracks ; thermal annealing

Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002

Topics: Electrical Engineering, Measurement and Control Technology , Physics

Type of Medium: Electronic Resource

URL: http://linkinghub.elsevier.com/retrieve/pii/1359-0189(86)90543-1

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext