ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We have built a combined scanning tunneling and scanning force microscope. Owing to the compact design of the instrument with Nomarski type of interferometry for lever deflection sensing, we achieved excellent stability with a total rms noise of 0.03–0.04 A(ring) in a frequency bandwidth of 0.01 Hz–2 kHz and a spectral noise density of 2.0×10−4 A(ring)/ (square root of)Hz at higher frequencies ((approximately-greater-than)2 kHz) using cantilevers with compliances of ∼150 N m−1. Simultaneous measurement of constant current contours, the acting forces, and the system compliance allows separation of sample topography from electronic and elastic effects.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142600
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