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  • 1
    Electronic Resource
    Electronic Resource
    A cryogenic microwave scanning near-field probe: Application to study of high-Tc superconductors (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 4348-4355 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report a vacuum cryogenic (80 K〈T〈350 K), near-field microwave scanning system based on a 90 GHz transmitting/receiving resonant slit antenna with a capacitive measurement of the probe-sample separation. The probe allows local measurement of resistance as a function of temperature with the spatial resolution of 20-50 μm. The mm-wave probe is integrated with the eddy-current probe which allows global measurement of resistance of conducting and superconducting samples. This integrated probe is used for local study of the superconducting transition in high-Tc superconducting thin films. The sensitivity of our present mm-wave probe is sufficient for probing conductivity in the normal state and in the superconducting state close to Tc however not yet sufficient for probing conductivity variations far below superconducting transition temperature. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150078
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  • 2
    Electronic Resource
    Electronic Resource
    Microwave near-field imaging of conducting objects of a simple geometric shape (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3927-3932 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We study imaging properties of a 90 GHz microwave scanning probe consisting of a thin slit aperture (width of 10–100 μm) in the waveguide endwall. We perform vector measurements of the near-field reflectivity of test samples (conducting dot, strip, half plane, plane) at various probe–sample separations and orientations. Experimental results for small objects agree fairly well with analytical calculations and computer simulations and can be described by a quasistatic model. Experimental results for extended conducting objects show pronounced deviations from the quasistatic model due to excitation of the surface waves. Our experimental results demonstrate several peculiar features which have not been properly addressed in the context of near-field imaging, namely: (i) strong collimation of the fields away from the probe up to a distance equal to the probe width, (ii) very weak phase dependence on distance in the extreme near field, and (iii) excitation of surface waves above conducting surfaces. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1289680
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  • 3
    Electronic Resource
    Electronic Resource
    Frequency modulation of the superconducting parallel-plate microwave resonator by laser irradiation (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 2875-2877 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the effect of chopped laser irradiation (λL=514 nm) on the resonant frequency (f0≈5.4 GHz) of a superconducting parallel-plate resonator (PPR) consisting of two thin epitaxial YBa2Cu3O7−x films. We demonstrate that laser irradiation shifts the resonant frequency of the PPR with negligible change of quality factor. Photoinduced deviation of f0 strongly depends on the chopping frequency and increases linearly with light intensity. The effect of illumination is attributed to the photoinduced change of the kinetic inductance due to laser heating. This effect may be used to produce phase modulation of the superconducting transmission lines. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112521
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  • 4
    Electronic Resource
    Electronic Resource
    Combined millimeter-wave near-field microscope and capacitance distance control for the quantitative mapping of sheet resistance of conducting layers (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 2832-2834 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a dual-frequency electromagnetic scanning probe and apply it for quantitative mapping of the sheet resistance of conducting films. The high-frequency (82 GHz) mode is used for image acquisition, while the low-frequency (5 MHz) mode is used for distance control. We measure magnitude and phase of the near-field microwave reflectivity from conducting films of varying thickness and develop a model which accounts fairly well for our results. This brings us to a quantitative understanding of the contrast in the microwave near-field imaging using an aperture probe, and allows us to achieve quantitative contactless characterization of conducting layers with sheet resistance even below 2 Ω. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122605
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  • 5
    Electronic Resource
    Electronic Resource
    Self-assembly of floating magnetic particles into ordered structures: A promising route for the fabrication of tunable photonic band gap materials (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 4168-4170 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report stable ordered arrays of millimeter-size magnetic particles floating on a liquid surface. Self-assembly into a regular two-dimensional lattice results from lateral magnetic interactions between the particles. The lattice constant may be easily tuned by the application of external magnetic field. The array symmetry is designed by using different particle shapes, magnets, and magnet position inside the particle, so that complex symmetries may be achieved. Three-dimensional ordered arrays are obtained in a stack of troughs containing floating magnets. Computer simulations of electromagnetic wave propagation in such three-dimensional structures suggest an opening of a tunable photonic band gap in the microwave range. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.125571
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  • 6
    Electronic Resource
    Electronic Resource
    Magnetic-field-modulated microwave reflectivity of high- Tc superconductors studied by near-field mm-wave microscopy (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 1766-1768 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report local studies of magnetic-field-modulated microwave reflectivity (MFMMR) of high-Tc superconductors using a near-field scanning aperture probe operating at 96 GHz. The MFMMR signal appears as a sharp peak at transition temperature and is very useful in identifying superconducting phases in multiphase samples. We show that MFMMR is qualitatively different from such a routine characterization tool as inductive technique. Simultaneous MFMMR and inductive measurements allow us to distinguish between the surface and bulk superconducting properties. The MFMMR technique may be easily extended for the study of giant magnetoresistance materials. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.124813
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  • 7
    Electronic Resource
    Electronic Resource
    High-frequency eddy-current technique for thickness measurement of micron-thick conducting layers (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1634-1636 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate a reflection-mode eddy-current technique operating in the 100 MHz to 5 GHz range. It allows contactless measurement of the thickness of conducting layers (Ag, Al, Cu, W, etc.) 0.1–1 μm thick with the spatial resolution of 1–2 mm. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1355298
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  • 8
    Electronic Resource
    Electronic Resource
    Local contactless measurement of the ordinary and extraordinary Hall effect using near-field microwave microscopy (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1776-1778 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a polarization-sensitive scanning microwave microscope based on a bimodal dielectric resonator with a cross-slit aperture. The microscope operates at ∼26 GHz in the reflection mode and has a subwavelength spatial resolution. It allows contactless mapping of the conductivity tensor, including magnetic-field-induced terms such as the Hall effect. We demonstrate local contactless measurement of the ordinary Hall effect in semiconducting wafers and of the extraordinary Hall effect in thin ferromagnetic Ni films. The latter yields out-of-plane magnetization. The microwave measurements are in good agreement with the dc Hall-effect measurements. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1456541
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  • 9
    Electronic Resource
    Electronic Resource
    Microwave near-field polarimetry (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 603-605 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a near-field microwave scanning probe which allows local phase-sensitive polarimetric measurements with a subwavelength spatial resolution (at least λ/16). The probe is a symmetrical transmitting/receiving antenna formed by two very narrow orthogonal slits fabricated at the end plate of a circular waveguide. A linearly polarized incident wave passes through one slit and is reflected from the sample mounted in the near field of the probe. A reflected wave with the incident polarization is received by the same slit, while the orthogonal polarization component is received by another, orthogonal slit. Our probe is very sensitive to local inhomogeneities and may be also useful for mapping Hall mobilities in semiconductors. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.124454
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  • 10
    Electronic Resource
    Electronic Resource
    Near-field scanning microwave probe based on a dielectric resonator (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 2073-2079 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report a near-field microwave microscopy based on a novel scanning probe—a long and narrow slot microfabricated on the convex surface of the dielectric resonator. The probe is mounted in the cylindrical waveguide. Tunable coupling to the probe is effectuated through the variable air gap. The whole probe is very compact, has a coaxial input, operates at 25–30 GHz, has a spatial resolution of 1–10 μm and, most important, has a low impedance of ∼20 Ω. This allows us to use it for characterization of metallic layers with high conductivity, in particular, thickness mapping. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1351837
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