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  • 3450H  (1)
  • PACS. 34. Atomic and molecular collision processes and interactions - 34.70.+e Charge transfer  (1)
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  • 1
    ISSN: 1434-6079
    Keywords: 3470 ; 3450H
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract For 3.6 MeV/u Sm q+ projectiles a hump in the projectile (L l +L α) x-ray emission cross section is seen as a function of charge stateq for highq with 46≦q≦52 (closed incomingL shell). This hump is attributed to the Resonant electron Transfer from the Xe target atom with simultaneous Excitation of anL 3-shell electron to theM shell. The cross section for thisL 3-shell RTE process has values up to 2·10−19 cm2, which is seen in single spectra already. To verify the existence of theL-shell RTE process for the studied collision system, extensive calculations have been carried out. Especially theL 3-shell fluorescence yield for the radiative stabilization process in the highly-charged projectile has been considered. Our calculatedq-dependent cross sections for the RTE process support the given interpretation.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1434-6079
    Keywords: PACS. 34. Atomic and molecular collision processes and interactions - 34.70.+e Charge transfer
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: Continuum X-rays emitted from Be- and C-targets bombarded with 75-290 MeV/u C6+ ions were observed with an HPGe detector placed at 90 to the beam direction. In all spectra two components could be clearly distinguished: Radiative Electron Capture into Continuum (RECC) forming a characteristic edge, and Secondary Electron Bremsstrahlung (SEB) which dominates at high photon energies. The shape of the spectra was compared to a theoretical description. A special emphasis was given to the details of the RECC edge. It has been found that at the highest projectile energy of 290 MeV/u, in opposite to the lower beam energies, the detailed structure of this edge cannot be reproduced satisfactory within the approach applied.
    Type of Medium: Electronic Resource
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