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Digitale Medien

Interfacial thickness in bilayers of poly(phenylene oxide) and styrenic copolymers (1998)

Merfeld, G. D. ; Karim, A. ; Majumdar, B. ; [weitere]

Bognor Regis [u.a.] : Wiley-Blackwell

Journal of Polymer Science Part B: Polymer Physics 36 (1998), S. 3115-3125

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Details

ISSN: 0887-6266

Schlagwort(e): interfacial thickness ; PPO ; SAN ; SMA ; neutron reflectivity NR ; binary interaction energies ; Physics ; Polymer and Materials Science

Quelle: Wiley InterScience Backfile Collection 1832-2000

Thema: Chemie und Pharmazie , Physik

Notizen: Estimates for the thickness of the interface between poly (2,6-dimethyl-1,4-phenylene oxide) (PPO) and copolymers of styrene-acrylonitrile (SAN) and styrene-maleic anhydride (SMA) based on the theory of Helfand and Tagami are compared to neutron reflectivity (NR) measurements. Good agreement is found between the NR measurements and theoretical predictions that make use of a mean field binary interaction model and previously reported binary interaction energies. The techniques outlined in this work may be used to understand relationships between the mechanical properties of multiphase polymer blends and the fundamental thermodynamics of polymer interactions. © 1998 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 36: 3115-3125, 1998

Zusätzliches Material: 7 Ill.

Materialart: Digitale Medien

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