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  • Polymer and Materials Science  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 35 (1988), S. 2183-2191 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Exposure of 25-μm films of polyimide and polyamideimide to high doses (〉 1015/cm2) of energetic ions (energy ≥ 100 keV) resulted in physical and chemical modification of the film surface. Cross-section microscopy revealed damaged layers extending beyond the projected ion range; conductivity in this damaged layer was found to be as high as 103ω-1 cm-1. Surface conductivity was found to be a function of ion energy and dose, with an exponential energy dependence from 200 to 900 keV. The temperature dependence and thermal stability of the surface conductivity were determined.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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