ISSN:
1432-0630
Schlagwort(e):
PACS: 77.80; 68.55; 81.60
Quelle:
Springer Online Journal Archives 1860-2000
Thema:
Maschinenbau
,
Physik
Notizen:
Abstract. Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P – E hysteresis loops. The frequency variation of the dielectric constant was measured as well.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1007/s003390050059
Permalink