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Digitale Medien

18O diffusion through amorphous SiO2 and cristobalite (1993)

Rodríguez-Viejo, J. ; Sibieude, F. ; Clavaguera-Mora, M. T. ; [weitere]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 63 (1993), S. 1906-1908

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Details

ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240–1500 °C, is about five times greater for vitreous silica than for β-cristobalite.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.110644

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