Electronic Resource
Geschke, O.
;
Rocher, H.
;
Noll, A.
;
[et al.]
Dreute, J.
;
Wiegel, B.
;
Hirzebruch, S.
;
Heinrich, W.
;
Sorensen, R.H.
;
Vetter, J.
;
Adams, L.
Amsterdam
:
Elsevier
International Journal of Radiation Applications & Instrumentation. Part D,
19 (1991), S. 891-894
ISSN:
1359-0189
Keywords:
LET
;
cosmic rays
;
microelectronic devices
;
radiation effects
;
single event upset
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/1359-0189(91)90335-F
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