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  • Articles: DFG German National Licenses  (33)
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  • Articles: DFG German National Licenses  (33)
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  • 1
    Electronic Resource
    Electronic Resource
    Line-broadening analysis of synchrotron x-ray diffraction data (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 2813-2816 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The advantages of using monochromatic and parallel synchrotron x rays for the microstructure analysis of polycrystalline materials have been studied. Analysis of line broadening from Pd powers showed encouraging results. Warren–Averbach analysis [J. Appl. Phys. 21, 595 (1950)] with respect to the three major crystal axes [111], [100], and [110] was done using 1-A(ring) x rays. Crystallite sizes and microstrains relative to the [111] direction were obtained using three different reflection pairs (111)-(222), (111)-(333), and (111)-(444). The fixed symmetrical instrument profile shape has major advantages in the correction of instrumental broadening and the determination of a low level (10−4 range) of stacking-fault probabilities.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.337872
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Experimental Thermodynamic Parameters for the Prediction of Natural Gas Hydrate Dissociation Conditions (1980)
    s.l. : American Chemical Society
    Industrial and engineering chemistry 19 (1980), S. 410-414 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/i160076a015
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Dissociation Pressures of Gas Hydrates Formed by Gas Mixtures (1972)
    s.l. : American Chemical Society
    Industrial and engineering chemistry 11 (1972), S. 26-35 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/i260041a006
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Additions and Corrections - Effect of Inhibitors on Hydrate Formation (1981)
    s.l. : American Chemical Society
    Industrial and engineering chemistry 20 (1981), S. 579-579 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/i200014a603
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Compressed liquid propene densities between 5 and 73.degree.C at pressures to 9.6 MPa (1987)
    s.l. : American Chemical Society
    Journal of chemical & engineering data 32 (1987), S. 311-313 
    Details
    ISSN: 1520-5134
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/je00049a009
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    Crystal-structure refinement by profile fitting and least-squares analysis of powder diffractometer data (1983)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 16 (1983), S. 611-622 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The refinement of crystal structures using X-ray powder data in a two-stage method is described. (1) The integrated intensities of the individual reflections are derived by a profile fitting method in which the profile shapes are accurately defined using an experimentally determined instrument function and the sum of Lorentzian curves. (2) These values are then used in a powder least-squares refinement for structure determination. The results obtained with three simple structures (silicon, quartz and corundum) gave R(Bragg) values of 0.7 to 2.5%. The necessity of correcting for preferred orientation and the importance of proper specimen preparation are also discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889883011176
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    Synchrotron X-ray polycrystalline diffractometry (1986)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 19 (1986), S. 92-100 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Results using parallel-beam polycrystalline geometry at the Stanford Storage Ring are compared with conventional X-ray tube focusing. The PC-automated instrumentation included a pair of vertical-scan diffractometers for wavelength selection using a Si(111) channel monochromator and for powder specimens which may be measured in reflection or transmission. The dependence of intensity, profile shape, width and position on instrument parameters is described. All the profiles in patterns of well crystallized specimens with a selected receiving slit are symmetrical and primarily Gaussian with nearly the same width, thereby greatly simplifying the algorithms and programs for profile fitting and interpretation of profile broadening. The easy wavelength selection allows the use of a wavelength just longer than the absorption edge of elements in the sample to obtain maximum P/B ratio, and short wavelengths permit access to very high hkls. Because of the absence of the Kα doublet and the simple symmetrical profile shape the resolution need not be as good as in focusing geometry to achieve comparable overlap separation. The average precision of lattice-parameter determination was Δd/d = 5.6 × 10−5 using forward reflections.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889886089859
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    Paper (German National Licenses)
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  • 8
    Electronic Resource
    Electronic Resource
    High-speed X-ray analysis (1978)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 11 (1978), S. 229-233 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The profile-fitting method was used to analyze data, collected at speeds up to 1° (2θ) per second with a computer-controlled diffractometer, which gave precise values of intensities and angles of reflections above a selected intensity threshold level. Powder diffraction data with 52 reflections in a 40° range were collected and analyzed in a few minutes. This technique has also been applied to X-ray fluorescence spectroscopy, and is applicable to single-crystal diffractometry and wavelength-dispersive electron microprobe analysis.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889878013217
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    Paper (German National Licenses)
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  • 9
    Electronic Resource
    Electronic Resource
    Refinement of simple crystal structures from synchrotron radiation powder diffraction data (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 394-401 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: X-ray powder diffractometry with storage-ring radiation was used to test various aspects of a method for refining simple crystal structures (Si, CeO2 and Co3O4). Excellent powder patterns were obtained with 0.17° resolution parallel slits and 1 Å X-rays. The intensities were determined with a double-Gaussian profile-fitting function and used in the powder least-squares refinement program POWLS. Except for Si, the peaks were broadened because of small particle sizes. The R(Bragg) values were in the range 0.4–1.7%.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086412
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    Paper (German National Licenses)
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  • 10
    Electronic Resource
    Electronic Resource
    Crystal structures of quartz and magnesium germanate by profile analysis of synchrotron-radiation high-resolution powder data (1988)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 182-191 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: High-resolution synchrotron-radiation powder data for quartz and Mg2GeO4, an olivine homologue, were obtained with a 365 mm long parallel-slit collimator with 0.05° aperture. The crystal structures were refined using a pseudo-Voigt profile fitting function and POWLS. Fourier maps were calculated from the measured structure factors of the germanate. The results for quartz were in good agreement with single-crystal data and R(Bragg) increased from 1.35 to 2.20% as the number of reflections included in the refinement increased from 46 to 119; the e.s.d.'s of the positional parameters were 4 to 8 × 10−4. The germanate gave R(Bragg) 4.85% using 77 Miller planes and the e.s.d.'s were 4 to 42 × 10−4. Special attention was given to the profile fitting function and the non-random particle distributions. The JCPDS Diffraction File Nos. will be reported in a later communication.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887011567
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    Paper (German National Licenses)
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