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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 3915-3919 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Metastable thin-film alloys of tin and silicon have been grown on room temperature substrates by pulsed laser deposition. The composition of the targets, made by pressing pellets of a mixture of tin and silicon powders, was maintained in the deposited films. The granular films consisted of tin nano-crystallites surrounded by an amorphous matrix. Deposited films with tin concentration greater than 15% showed metallic behavior, optically as well as electrically, while films with tin contents less than 15% displayed optical bandgaps ranging from 100 to 300 meV. Charge transport in the semiconducting films can be modeled by a combination of conduction in extended states and hopping at the Fermi level. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 1532-1535 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ballistic electron emission microscopy (BEEM) has been performed on Au/ZnSe (001) diodes prepared in ultra high vacuum. An average barrier height (BH) of 1.37 eV is found for Au/n-ZnSe in close agreement with previously published values for diodes measured by conventional techniques. The BH distribution is relatively narrow, from 1.32 to 1.43 eV, consistent with cross-sectional transmission electron microscopy which indicates that the interface is abrupt, and without reaction products. These results differ from those reported for BEEM measurements on chemically etched Au/ZnSe diodes. [R. Coratger et al., Phys. Rev. B. 51, 2357 (1995)]. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 3213-3218 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial self-assembled silicide nanowires can be grown on Si (001) if the magnitude of the lattice mismatch between epilayer and substrate is large along one crystal axis and small along the perpendicular axis. This phenomenon is illustrated with four examples: ScSi2, ErSi2, DySi2, and GdSi2, which have lattice mismatches of −4.6%, 6.3%, 7.6%, and 8.9%, respectively, along one of the Si 〈110〉 directions and mismatches of 0.8%, −1.6%, −0.1%, and 0.8%, respectively, along the perpendicular Si〈110〉 direction. The resulting self-assembled nanowires have widths and heights in the range of 3–11 and 0.2–3 nm, depending on the lattice mismatches. The average lengths of the nanowires are in the range 150–450 nm, and are determined primarily by kinetic issues. The epitaxial growth of silicide nanowires should prove interesting to those studying quasi-one- dimensional systems. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 5226-5232 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Submonolayer coverages of Au on GaAs(001) substrates prepared by various ex situ chemical cleaning procedures using low-energy ion scattering techniques are investigated. This research is compared with previous results for 1 ML of Au deposited on Si(111). A comparison of the energy spectra showed substantial broadening in the Li+ backscattering ion peak from Au deposited on GaAs, as compared to the Au on Si. Li+ impact collision ion scattering spectroscopy (ICISS) results showed that the gold formed an ordered overlayer above the Si surface, which was thermally stable to 500 °C. Even for depositions on room-temperature GaAs(001), shadowing of Au by substrate atoms at low scattering angles showed that Au penetrated below the GaAs surface. The estimate of the average penetration depth into the room-temperature substrate is two to three atomic planes of the GaAs crystal. An ICISS experiment showed that the Au atoms sampled by the ion beam were not ordered on lattice sites, but appeared to occupy multiple and/or random positions within the substrate. Upon annealing to 300 °C, the gold atoms were more ordered, but did not penetrate significantly further into the GaAs. At higher annealing temperatures, the Au either diffused further into the substrate or became incorporated in islands, and occupied favored subsurface sites.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Chemistry of materials 2 (1990), S. 492-494 
    ISSN: 1520-5002
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Chemistry of materials 5 (1993), S. 84-89 
    ISSN: 1520-5002
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Chemistry of materials 5 (1993), S. 479-485 
    ISSN: 1520-5002
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Chemistry of materials 2 (1990), S. 695-700 
    ISSN: 1520-5002
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 3097-3101 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The current-voltage (I-V) characteristics, dc conductivity, and infrared spectra of cuprous chloride (CuCl) thin films of different thicknesses have been experimentally investigated. The absorption peak energy in the infrared spectra and the activation energy obtained from resistivity measurements were found to be the same. This may be attributed to the existence of an indirect gap EΓX =0.41 eV. It was also observed that as the thickness of the samples decreased the absorption peaks shifted toward higher energies. This is thought to be due to the creation of strain within the lattice when the samples are prepared by molecular-beam epitaxy and has been explained on the basis of quantum size effects.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 433-440 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An apparatus for using low-energy ion scattering to study surface crystallography is described. The ion source can produce highly collimated beams of either noble gas or alkali metal ions with energies up to 30 keV. A versatile manipulator has been built that enables the entire UHV chamber to be translated and rotated in order to easily orient it with respect to the ion beam. The sample is mounted on a manipulator with two independent rotations, three translations, and a tilt, and can be oriented such that the sample normal or an arbitrary bulk crystal axis may be parallel to the incident ion beam within 0.1°. Ions that have scattered from a single crystal surface are detected with either a large solid angle two-dimensional imaging detector or with a high-resolution angle-resolving electrostatic analyzer. The backscattered ion image on the large area detector may be viewed in real time and with the aid of a video digitization system to determine the bulk stereogram of a crystal, and provide information about the near surface atomic structure. The electrostatic analyzer position is rotatable with respect to the incident ion beam direction, allowing scattering angles from 0° to 166° to be achieved. Examples of data collected with the instrument are presented.
    Type of Medium: Electronic Resource
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