Abstract
The X-ray reflectivity technique was applied in the study of tin oxide films deposited by sol-gel dip-coating on borosilicate glasses. The influence of the withdrawal speed and temperature of thermal treatment on the film structure was analyzed. We have compared the thermal evolution of the density and the shrinkage of the films with these properties measured for the monolithic xerogel by helium picnometry and thermomechanical analysis. In agreement with the Landau-Levich model, the layer thickness increases by increasing the withdrawal speed. Nevertheless, it decreases with the increase of the thermal treatment temperature, due to the densification process. The values of apparent density are smaller than the skeletal density, which shows that the films are porous. The comparison between the film and the monolith indicates that shrinkage during firing is anisotropic, occurring essentially perpendicular to the coating surface.
Similar content being viewed by others
References
S.J. Blunden, P.A. Cusack, and R. Hill, The Industrial Uses of Tin Chemicals (Royal Soc. Chem., London, 1985), Ch. 9 and 10.
K.L. Chopra, S. Major, and D.K. Pandya, Thin Solid Films 102, 1 (1983).
L.V.A. Scalvi, F.R. Messias, A.E. Souza, M. Siu Li, C.V. Santilli, and S.H. Pulcinelli, J. Sol-Gel Sci. Techn. 13, 793 (1998).
C. Goebbert, M.A. Aegerter, D. Burgard, R. Nass, and H. Schmidt, J. Mater. Chem. 9, 253 (1999).
C.J. Brinker and G.W. Sherer, Sol-Gel Science: The Physics and Chemistry of Sol-Gel Processing (Academic Press, San Diego, 1990), p. 718.
L.R.B. Santos, A. Larbot, C.V. Santilli, and S.H. Pulcinelli, J. Sol-Gel Sci. Techn. 13, 805 (1998).
A.P. Rizzato, C.V. Santilli, S.H. Pulcinelli, and Y. Messaddeq, J. Non-Cryst. Solids 256/257, 154 (1999).
L.D. Landau and B.G. Levich, Acta Physicochim. URSS 17, 42 (1942).
M. Guglielmi and S. Zenezini, J. Non-Cryst. Solids 121, 303 (1990).
G.E.S. Brito, C.V. Santilli, S.H. Pulcinelli, and A.F. Craievich, J. Non-Cryst. Solids 217, 41 (1997).
L. Névot and P. Croce, Rev. Phys. Appl. 15, 761 (1980).
J.M. Grimal, P. Chartier, and P. Lehuédé, J. Non-Cryst. Solids 196, 128 (1996).
M. Hüppauff, K. Bange, and B. Lengeler, Thin Solid Films 230, 191 (1993).
C.V. Santilli, S.H. Pulcinelli, G.E.S. Brito, and V. Briois, J. Phys. Chem. B103, 2661 (1999).
M.W. Weiser and L.C. De Jongue, J. Am. Ceram. Soc. 69, 822 (1986).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Rizzato, A., Santilli, C. & Pulcinelli, S. Characterization of Tin Oxide Based Sol-Gel Coatings on Borosilicate Glasses by X-Ray Reflectivity. Journal of Sol-Gel Science and Technology 19, 811–816 (2000). https://doi.org/10.1023/A:1008724503396
Issue Date:
DOI: https://doi.org/10.1023/A:1008724503396