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Use of thin films to study pore distribution over depth of range of Ar+ ions in nickel

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Literature Cited

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Authors
  1. A. G. Guglya
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  2. V. A. Gusev
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  3. V. F. Zelenskii
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  4. B. V. Matvienko
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  5. I. M. Neklyudov
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Additional information

Translated from Atomnaya Énergiya, Vol. 48, No. 3, pp. 175–177, March, 1980.

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Guglya, A.G., Gusev, V.A., Zelenskii, V.F. et al. Use of thin films to study pore distribution over depth of range of Ar+ ions in nickel. At Energy 48, 197–199 (1980). https://doi.org/10.1007/BF01142151

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  • DOI: https://doi.org/10.1007/BF01142151

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