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Indexed X-ray diffraction data for the sialon X-phase

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Author notes

  1. A. Zangvil

    Present address: Department of Metallurgy and Mining Engineering, University of Illinois, 61801, Urbana, Illinois, USA

  2. L. J. Gauchkler

    Present address: Alusuisse Ltd., CH-8212, Neuhausen, Switzerland

Authors and Affiliations

  1. Institut für Werkstoffwissenschaften, Max-Planck-Institut für Metallforschung, Stuttgart, Germany

    A. Zangvil, L. J. Gauchkler & M. Rühle

Authors
  1. A. Zangvil
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  2. L. J. Gauchkler
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  3. M. Rühle
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Zangvil, A., Gauchkler, L.J. & Rühle, M. Indexed X-ray diffraction data for the sialon X-phase. J Mater Sci 15, 788–790 (1980). https://doi.org/10.1007/BF00551748

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  • DOI: https://doi.org/10.1007/BF00551748

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