Abstract
Previously published data are re-examined in the light of a grain-boundary model for monocrystalline films. New interpretations are proposed which show that the thermoelectric power due to thickness-dependent scattering attains a constant value.
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References
W. F. Leonard andS. F. Lin,Thin Solid Films 11 (1972) 273.
P. Wissmann,ibid. 5 (1970) 329.
F. Thieme andW. Kirstein,ibid. 30 (1975) 371.
C. R. Tellier andA. J. Tosser,Electrocomp. Sci. Technol. 3 (1976) 165.
E. H. Sondheimer,Adv. Phys. 1 (1952) 1.
C. R. Tellier andA. J. Tosser,Thin Solid Films 70 (1980) 225.
C. R. Tellier, C. R. Pichard andA. J. Tosser,ibid. 76 (1981) 129.
K. L. Chopra, “Thin Film Phenomena” (McGraw Hill, New York, 1969).
C. R. Tellier, L. Hafid andA. J. Tosser,Appl. Phys. 23 (1980) 357.
R. D. Barnard, “Thermoelectricity in Metals and Alloys” (Taylor and Francis, London, 1972).
A. A. Cottey,Thin Solid Films 4 (1967/68) 297.
C. R. Tellier andA. J. Tosser, “Size Effects in Thin Films” (Elsevier, Amsterdam, 1982) Ch. 1.
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Richard, C.R., Guendouz, L., Tosser, A.J. et al. A reinterpretation of the effects of impurities on the thermoelectric power of thin gold films. J Mater Sci 19, 3940–3944 (1984). https://doi.org/10.1007/BF00980757
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DOI: https://doi.org/10.1007/BF00980757