Abstract
An anomalous temperature dependence of magnetoresistance (MR) of Co/Cu multilayer films witha ∼3 Å thick magnetic layer has been established experimentally. The temperature of the MR maximum T max is shown to coincide with the Néel temperature. The variation of T max with the Cu layer thickness follows an oscillatory pattern.
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Translated from Fizika Tverdogo Tela, Vol. 42, No. 9, 2000, pp. 1641–1643.
Original Russian Text Copyright © 2000 by Kim, Khalyapin, Turpanov, Li, Beten’kova, Kan.
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Kim, P.D., Khalyapin, D.L., Turpanov, I.A. et al. Anomalous temperature dependence of the magnetoresistance in Co/Cu multilayers. Phys. Solid State 42, 1688–1690 (2000). https://doi.org/10.1134/1.1309452
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DOI: https://doi.org/10.1134/1.1309452