The quantum size effect in thin antimony films

Abstract

Thin antimony films have been epitaxially deposited at 350K onto cleavage surfaces of mica at different residual gas pressures between 10⁻⁵ and 10⁻⁹ torr, and their resistivity ∂ measured as a function of film thicknessd≦500Å at temperaturesT=110K andT=300K. The ∂(d) characteristics of films deposited at residual gas pressures of about 10⁻⁶ torr with condensation rates of about 1Å/s showed generally decreasing slopes as film thicknesses increased, but irregularities in detail. The ∂(d) characteristics of films deposited at 10⁻⁸ torr with the same condensation rate decreasing with increasingd, too, show no such irregularities but very small regular variations of ∂(d) with constant oscillation length Δd between the maxima, and decreasing amplitudes with increasingd. These variations are better recognizable in a modified ∂(d) graph. We tend to interprete these variations by the quantum size effect as we found oscillation lengths and amplitudes compatibel with theory.