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Thickness dependence of the spin- and angle-resolved photoemission of ultrathin, epitaxial Ni(111)/W(110) layers

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Abstract

The thickness dependence of the magnetic band structure of ultrathin, epitaxial Ni(111)/W(110) layers has been studied by spin and angle-resolved photoemission spectroscopy. The changes of the spin-resolved photoemission intensities upon reducing the layer thickness depend strongly on the wavevector along the Γ-L line of the Brillouin zone. The measured exchange splittingΔ atk ≃1/3(Γ-L) andk ≃1/2(Γ-L) is found to be independent of the layer thickness for layers consisting of 3 or more atomic layers, whileΔ decreases rapidly with the layer thickness atk≃2/3(Γ-L). This behavior is very similar to the temperature dependence of the spin-resolved photoemission spectra of bulk Ni(111) at the samek-points.

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  1. W. Schmitt

    Present address: Bayer AG, D-4150, Krefeld-Ürdingen, Fed. Rep. Germany

Authors and Affiliations

  1. 2. Physikalisches Institut, RWTH Aachen, D-5100, Aachen 1, Fed. Rep. Germany

    K. -P. Kämper, W. Schmitt, D. A. Wesner & G. Güntherodt

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  1. K. -P. Kämper
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  2. W. Schmitt
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  3. D. A. Wesner
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  4. G. Güntherodt
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Kämper, K.P., Schmitt, W., Wesner, D.A. et al. Thickness dependence of the spin- and angle-resolved photoemission of ultrathin, epitaxial Ni(111)/W(110) layers. Appl. Phys. A 49, 573–578 (1989). https://doi.org/10.1007/BF00616982

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  • DOI: https://doi.org/10.1007/BF00616982

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