Phénomènes de diffraction produits par les systèmes stratifiés à distribution d'atomes partiellement différente de couche à couche

Order-disorder relations have been studied by electron diffraction in a lamellar system consisting of stacked layers in which some atoms are partially disordered. The analysis of a single reciprocal-space section permits the derivation of the defect distribution in a layer as a whole if there is no correlation between the distribution of defects in different layers. The method is applied to the study of isomorphic substitutions in microcrystallized layer silicates such as beidellite and illite.