Conclusion
As is demonstrated in the present work, the zero-field technique is a powerful method in studying diffusion/trapping of the μ+, especially for the case of slow hopping. In the case of MnSi, the hopping time τc has been determined to be longer than 20 μsec, with the width of the nuclear random fields Δ/γμ = 3.80 ± 0.4 Oe. The role of the μ+ in low-field relaxation studies is unique, since it provides information inaccessible to NMR techniques.
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References
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Work supported by Japan Society for the Promotion of Science, the Toray Science Foundation, the Grant-in-Aid of the Japanese Ministry of Education, Culture and Science, and the Atomic Energy Control Board and National Research Council of Canada.
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Hayano, R.S., Uemura, Y.J., Imazato, J. et al. Zero- and low-field μ+ spin relaxation behavior in MnSi. Hyperfine Interact 6, 133–136 (1979). https://doi.org/10.1007/BF01028781
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DOI: https://doi.org/10.1007/BF01028781