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Characterization of the SiC and TiN whisker microstructure

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Abstract

Five criteria for evaluating the whisker microstructure have been suggested, which include (1) proportion of “perfect” single crystals, (2) morphology and growth direction, (3) length, diameter and ratio ofL/D, (4) the bulk and surface chemistries, (5) defects and their distribution. Three sets of commercially available SiC whiskers made in two countries and the TiN whiskers were characterized in terms of the above criteria.

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Authors and Affiliations

  1. Central Iron and Steel Research Institute, 100081, Beijing, People's Republic of China

    J. Zhu & H. G. Xu

  2. Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, 110015, Shenyang, People's Republic of China

    X. G. Ning, K. Y. Hu, W. Cao & H. Q. Ye

Authors
  1. J. Zhu
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  2. X. G. Ning
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  3. H. G. Xu
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  4. K. Y. Hu
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  5. W. Cao
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  6. H. Q. Ye
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Zhu, J., Ning, X.G., Xu, H.G. et al. Characterization of the SiC and TiN whisker microstructure. J Mater Sci 26, 3202–3208 (1991). https://doi.org/10.1007/BF01124664

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  • DOI: https://doi.org/10.1007/BF01124664

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