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Atomic force microscopy studies of two-dimensional epitaxial growth of Bi2Sr2−xLaxCuO6+δ thin films

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Journal of Materials Science Letters

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Authors and Affiliations

  1. National Laboratory for Superconductivity, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing, 100080, People's Republic of China

    Y. Z. Zhang, H. T. Yang, L. Li, D. G. Yang, H. J. Tao, B. R. Zhao & Z. X. Zhao

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  1. Y. Z. Zhang
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  2. H. T. Yang
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  3. L. Li
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  4. D. G. Yang
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Zhang, Y.Z., Yang, H.T., Li, L. et al. Atomic force microscopy studies of two-dimensional epitaxial growth of Bi2Sr2−xLaxCuO6+δ thin films. Journal of Materials Science Letters 16, 1095–1098 (1997). https://doi.org/10.1023/A:1018555514784

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