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Fluorine determination in the near surface region of solids using the19F(p, p′γ)19F resonance reaction

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Abstract

Fluorine surface contamination and depth profiles were studied using the19F(p, p'γ)19F resonance reaction. Fluorine implanted silicon samples as well as ZrNb plates and Cr−Al layers after a HF-treatment have been examined. The resonance strengths of the narrow 1088 keV resonance were estimated.

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Authors and Affiliations

  1. Central Institute of Nuclear Research, Rossendorf, 8051, Dresden, (GDR)

    D. Grambole, C. Bauer, P. Gippner, C. Heiser, W. Rudolph & H. -J. Thomas

Authors
  1. D. Grambole
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  2. C. Bauer
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  3. P. Gippner
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  4. C. Heiser
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  5. W. Rudolph
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  6. H. -J. Thomas
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Grambole, D., Bauer, C., Gippner, P. et al. Fluorine determination in the near surface region of solids using the19F(p, p′γ)19F resonance reaction. Journal of Radioanalytical and Nuclear Chemistry, Articles 83, 107–115 (1984). https://doi.org/10.1007/BF02209300

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  • DOI: https://doi.org/10.1007/BF02209300

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