Summary
Epitaxial films of YBa2Cu3O7−x were depositedin situ on LaAlO3 substrates using single-target 90° off-axis sputtering. The films were characterized by magnetization measurements (M vs. T, H), applying the field parallel toc-axis. The observed differences in theT c andJ c values are attributed to the different oxygen content in the superconducting films.
Similar content being viewed by others
References
C. P. Bean:Phys. Rev. Lett.,8, 850 (1962).
F. Celani, A. Saggese, S. Pace, L. Liberatori andN. Sparvieri:Mater. Chem. Phys.,25, 43 (1990).
H. Zang andH. Sato:Phys. Rev. Lett.,70, 1697 (1993).
M. Reissner, W. Stainer, C. Czurda, H. W. Weber, A. Wisniewski, P. X. Zang andL. Zhou:Proceedings of the VII International Workshop on Critical Currents in Superconductors, edited byH. W. Weber (World Scientific, 1994), p. 451.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Sparvieri, N., Fiorello, A.M., Fiorani, D. et al. Growth and magnetic characterization of YBCO films. Nouv Cim D 16, 1987–1991 (1994). https://doi.org/10.1007/BF02471856
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF02471856