Influence of deposition temperature on the superconductivity of Y_1−x HoxBa₂Cu₃O_{7 −δ}films produced by dc-magnetron sputtering

Abstract

Experimental results of research on the influence of deposition temperature (T _s) on crystal structure and superconductivity of Y_1−x HoxBa₂Cu₃O_{7 −δ} (YHBCO) films deposited by dcmagnetron sputtering are reported. X-ray diffraction analysis showed that the films grew with preferential orientation of thec-axis normal to the substrate surface in the range of temperature 750–820°C. The single-crystal structure of the YHBCO films grown epitaxially at the optimal substrate temperatures of 820, 800, 760, and 750°C, respectively, have been established by rocking curves, Φ-scan, and electron channeling pattern (ECP). Typical values of the critical current density (A · cm⁻²) at 77 K and 0.1 T field are 2.1×10⁵, 4×10⁵, 6.2×10⁵, and 3.1×10⁵ for thex=0, 0.2, 0.4, 0.7 films respectively, measured by a Quantum Design magnetrometer (H∥c).