Abstract
Two novel plasma chemistries, BI 3 and BBr 3 , have been employed for dry etching of LaCaMnO 3 thin films. For both mixtures there is some chemical enhancement of etch rates at low halide compositions in the discharge, and the rates are a strong function of ion/neutral ratio. Maximum rates are obtained at ratios near 0.02. Etch yields are typically low (<0.3) under inductively-coupled plasma (CICP) conditions. Smooth d surface morphologies are obtained over a wide range of conditions, with high-fidelity pattern transfer using SiO 2 or SiN x masks.
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Wang, J.J., Cho, H., Childress, J.R. et al. Iodine- and Bromine-Based Dry Etching of LaCaMnO3 . Plasma Chemistry and Plasma Processing 19, 229–239 (1999). https://doi.org/10.1023/A:1021643709200
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DOI: https://doi.org/10.1023/A:1021643709200