Abstract
Impurity distributions in semiconductor melts and crystals grown from these melts are experimentally and numerically studied on an example of Ga-doped Ge crystals. It is shown that inhomogeneous dopant distribution is observed in the form of striations and is caused by the convective flows in the melt and their nonstationary rearrangement in the vicinity of the crystallization front. The character of heat and mass transfer under the microgravity conditions is predicted. The necessity of precision experiments under terrestrial and, especially, space conditions is emphasized.
Similar content being viewed by others
References
D. Joseph, Stability of Fluid Motions (Springer-Verlag, Heidelberg, 1976; Mir, Moscow, 1981).
V. I. Polezhaev, M. S. Bello, N. A. Verezub, et al., Mathematical Simulation of Convective Heat and Mass Transfer Based on the Navier-Stokes Equations (Nauka, Moscow, 1987).
G. K. Batchelor, An Introduction to Fluid Dynamics (Cambridge University Press, Cambridge, 1967; Mir, Moscow, 1973).
L. I. Sedov, A Course in Continuum Mechanics (Nauka, Moscow, 1970; Wolters-Noordhoff, Groningen, 1971-1972).
S. D. Grishin, V. B. Dubovskii, S. S. Obydennikov, and V. V. Savichev, Technological Experiments under Microgravity (Ural’skii Nauchn. Tsentr, Sverdlovsk, 1983), p. 6.
C. I. Christov and P. K. Volkov, J. Fluid Mech. 158, 341 (1985).
N. K. Ermakov, S. A. Nikitin, and V. I. Polezhaev, Izv. Ross. Akad. Nauk, Mekh. Zhidk. Gaza, No. 3, 21 (1997).
G. Muller, Crystal Growth from the Melt (Springer-Verlag, Berlin, 1988; Mir, Moscow, 1991).
Author information
Authors and Affiliations
Additional information
__________
Translated from Kristallografiya, Vol. 45, No. 5, 2000, pp. 935–943.
Original Russian Text Copyright © 2000 by Volkov, Zakharov, Serebryakov.
Rights and permissions
About this article
Cite this article
Volkov, P.K., Zakharov, B.G. & Serebryakov, Y.A. Convection in melts and impurity distribution in semiconductor crystals. Crystallogr. Rep. 45, 862–870 (2000). https://doi.org/10.1134/1.1312937
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1134/1.1312937