Abstract
Plasticization is detected during stress relaxation in uniaxially loaded LiF single crystals irradiated with an ultraweak flux of thermalized neutrons (UFTN) with intensity I n∼100 neutrons/cm2s. It is shown that when loaded LiF samples are irradiated with an UFTN, excitation of the electronic subsystem of the crystal is observed and is manifested in a stimulation of deformation exoemission of electrons and the generation of F centers.
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Pis’ma Zh. Éksp. Teor. Fiz. 70, No. 2, 118–123 (25 July 1999)
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Lipson, A.G., Sakov, D.M., Savenko, V.I. et al. Plasticization effect and the excitation of the electronic subsystem in an LiF single crystal by an ultraweak thermalized-neutron flux in the stress-relaxation regime. Jetp Lett. 70, 123–128 (1999). https://doi.org/10.1134/1.568140
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DOI: https://doi.org/10.1134/1.568140