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Depth-selective57Fe mössbauer spectroscopy: An alternative

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Abstract

A method to obtain depth-selective57Fe Mössbauer spectra is described. The depth selectivity is implemented by removing thin layers from a sample and measuring the conversion-electron Mössbauer spectrum. The layer spectra, i.e. the Mössbauer spectra associated with the removed layers, are then determined by calculating the number of electrons which originate from each layer and reach the surface of the sample. The computations are based on Liljequist's theory for57Fe conversion-electron Mössbauer spectroscopy. In this way no energy-discriminating electron spectrometers are involved, and a simple proportional counter will suffice. The depth resolution is about 20–30 nm. The method is illustrated for an ion-implanted substituted YIG film, in which case the magnetization as a function of depth is obtained.

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Authors and Affiliations

  1. Philips Research Laboratories, Eindhoven, The Netherlands

    P. H. Smit & R. P. van Stapele

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  1. P. H. Smit
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  2. R. P. van Stapele
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Smit, P.H., van Stapele, R.P. Depth-selective57Fe mössbauer spectroscopy: An alternative. Appl. Phys. A 28, 113–117 (1982). https://doi.org/10.1007/BF00617140

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  • DOI: https://doi.org/10.1007/BF00617140

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