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Time-of-flight investigation of the intensity dependence of laser-desorbed positive ions from SrF2

  • Surfaces and Multilayers
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Abstract

The intensity dependence of the total and specific yields of positive ions desorbed from SrF2 under 193 nm and 308 nm excimer-laser irradiation has been investigated by the time-of-flight method. The following positive ion species have been detected: F+, Sr+, Sr++, SrF++ and SrF +2 . The Sr+ and SrF+ emission yields are found to increase as E n, where E represents the laser energy per pulse. The exponent n is related to defect-initiated neutral particle emission and gas-phase ionization. The influence of surface damage on this power dependence is investigated. The F+ emission yield showed a quite different behaviour compared to that of the Sr+ and SrF+ emission. At both wavelengths the total positive ion emission yields saturate at a certain laser energy. In the saturation regime the SrF+ emission vanishes and alternative emission of F+ and Sr+ was observed at both wavelengths, but the total emission yield in the saturation regime (F+ + Sr+) remained constant. A Scanning Electron Microscope (SEM) was used to investigate the damage spots after laser irradiation for thermal effects.

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Authors and Affiliations

  1. Institut für Allgemeine Physik, Wiedner Hauptstrasse 8–10, A-1040, Wien, Austria

    O. Kreitschitz, W. Husinsky & G. Betz

  2. Department of Physics and Astronomy, Vanderbilt University, 37235, Nashville, TN, USA

    N. H. Tolk

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  1. O. Kreitschitz
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  2. W. Husinsky
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  3. G. Betz
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  4. N. H. Tolk
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Kreitschitz, O., Husinsky, W., Betz, G. et al. Time-of-flight investigation of the intensity dependence of laser-desorbed positive ions from SrF2 . Appl. Phys. A 58, 563–571 (1994). https://doi.org/10.1007/BF00348167

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