Abstract
Opaque samples are imaged by Scanning Nearfield Optical Microscopy (SNOM) in reflection mode: A quartz glass fiber tip is used both to illuminate the sample and to collect light locally reflected from or emitted by the surface. The collected light is coupled out by a 2×2 fiber coupler and fed into a grating spectrometer for spectral analysis at each sampled point. The tip-sample distance is controlled by a shear-force feedback system. The simultaneous measurement of topography and optical signals allows an assessment of imaging artifacts, notably topography-induced intensity changes. It is demonstrated that an optical reflectance contrast not induced by topographic interference can be found on suitable samples. Local spectral analysis is shown in images of a photoluminescent layer.
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D.W. Pohl, W. Denk, M. Lanz: Appl. Phys. Lett. 44, 651 (1984)
U.Ch. Fischer, U.T. Dürig, D.W. Pohl: Appl. Phys. Lett. 52, 249 (1988)
R.C. Reddick, R.J. Warmack, T.L. Ferrell: Phys. Rev. B 39, 767 (1989)
D. Courjon, K. Sarrayeddine, M. Spajer: Opt. Commun. 71, 23 (1989)
M. Spajer, D. Courjon, K. Sarayeddine, A. Jalocha, J.-M. Vigoureux: J. Phys. (Paris) III 1, 1 (1991)
D.W. Pohl: In Advances in Optical and Electron Microscopy (Academic, New York 1991) pp. 243–312
E. Betzig, P.L., Finn, J.S. Weiner: Appl. Phys. Lett. 60, 2484 (1992)
R. Toledo-Crow, P.C. Yang, Y. Chen, M. Vaez-Iravani: Appl. Phys. Lett. 60, 2957 (1992)
SiO2 monomode fibers with GeO2 doped core were kindly provided by Siecor GmbH, Neustadt/Coburg, Germany
Model P-2000 fiber puller, Sutter Instrument Company, Novato CA, USA
The pattern was originally designed by J. Cline and fabricated in collaboration with J. Cline and G. Valaskovicz
F. Bruder, R. Brenn: Phys. Rev. Lett. 69, 624 (1992). The PS/PBrS samples studied in this work were kindly provided by F. Bruder and R. Brenn, Albert-Ludwigs-Universität, Freiburg, Germany
M. Pirzer, M.Ch. Lux-Steiner, E. Bucher: Appl. Phys. Lett. 60, 2957 (1992)
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Bielefeldt, H., Hörsch, I., Krausch, G. et al. Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples. Appl. Phys. A 59, 103–108 (1994). https://doi.org/10.1007/BF00332201
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DOI: https://doi.org/10.1007/BF00332201