X-ray misorientation contrast for a (lineage) subgrain boundary

The separation or overlapping of adjacent subgrain images in Berg-Barrett X-ray (reflection) micrographs is described for a reasonably general misorientation between the crystal subgrains. The five crystallographic parameters which describe the diffraction experiment also specify, effectively, the direction of the rotation axis for the misorientation, the amount of the angular misorientation, and the relative orientation of the subgrain boundary interface.