Abstract
Epitaxial, uniformly strained superlattices of ferroelectric KNbO3 and paraelectric KTaO3 are studied with respect to their structural and dielectric properties. For dielectric measurements, perfectly lattice-matched conducting KNbO3Sr(Ru0.5Sn0.5)O3 electrodes are used, and a broad, frequency-dependent maximum is observed in the capacitance-vs-temperature curves. Niobium K-edge glancing-angle EXAFS provides information regarding the crystal structure of KNbO3 films as thin as two unit cells in superlattices with equal KTaO3 and KNbO3 layer thicknesses, showing a clear difference between these thinnest-layer superlattices and films of the KNbO3K(Ta0.5Nb0.5O3 solid-solution. X-ray diffraction measurements, on the other hand, indicate that these samples exhibit the same transition temperature KNbO3Tc, indicating the importance of long-range electrostatic interactions. Analysis of the transition temperature for various structures leads to a clear identification of the effect of size and strain on KNbO3Tc.
Similar content being viewed by others
References
F. Tsai and J.M. Cowley, Appl. Phys. Lett., 65, 1906 (1994).
S.B. Ren, C.J. Lu, J.S. Liu, H.M. Shen, and Y.N. Wang, Phys. Rev., B54, R14337 (1996).
P. Ayyub, V.R. Palkar, S. Chattopadhyay, and M. Multani, Phys Rev., B51, 6135 (1995); S. Chattopadhyay, P. Ayyub, V.R. Palkar, and M. Multani, ibid., 52, 13177 (1995).
M.H. Frey and D.A. Payne, Appl. Phys. Lett., 63, 2753 (1993).
Y. Yano, K. Iijima, Y. Daitoh, T. Terashima, and Y. Bando, J. Appl. Phys., 76, 7833 (1994).
H. Tabata and T. Kawai, Appl. Phys. Lett., 70, 321 (1997).
A. Erbil, Y. Kim, and R.A. Gerhardt, Phys. Rev. Lett., 77, 1628 (1996).
I. Kanno, S. Hayashi, R. Takayama, and T. Hirao, Appl. Phys. Lett., 68, 328 (1996).
H.-M. Christen, E.D. Specht, D.P. Norton, M.F. Chisholm, and L.A. Boatner, Appl. Phys. Lett., 72, 2535 (1998).
E.D. Specht, H.-M. Christen, D.P. Norton, and L.A. Boatner, Phys. Rev. Lett., 80, 4317 (1998).
I.J. Pickering, and G.N. George, Inorganic Chemistry, 34, 3142 (1995).
http://www-ssrl.slac.stanford.edu/exafspak.html
J.J. Rehr, J. Mustre de Leon, S.I. Zabinsky, S.I., R.C. Albers, J. Am. Chem. Soc., 113, 5135 (1991).
S.J. Pennycook and D.E. Jesson, Phys. Rev. Lett., 64, 938 (1990).
S. Yilmaz, T. Venkatesan, and R. Gerhard-Mulhaupt, Appl. Phys. Lett., 58, 2479 (1991).
H.-M. Christen, L.A. Boatner, J.D. Budai, M.F. Chisholm, L.A. Gea, P.J. Marrero, and D.P. Norton, Appl. Phys. Lett., 68, 1488 (1996).
H.-M. Christen, D.P. Norton, L.A. Gea, and L.A. Boatner, Thin Solid Films, 312, 156 (1998).
H.-M. Christen, L.A. Boatner, J.D. Budai, M.F. Chisholm, L.A. Gea, D.P. Norton, Ch. Gerber, and M. Urbanik, Appl. Phys. Lett., 70, 2147 (1997).
A.W. Hewat, J. Phys. C: Solid State Phys., 6, 2559 (1973).
E. Wiener-Avnear, Appl. Phys. Lett., 65, 1784 (1994).
H. Tabata, H. Tanaka, and T. Kawai, Appl. Phys. Lett., 65, 1970 (1994).
B.D. Qu, M. Evstigneev, D.J. Johnson, and R.H. Prince, Appl. Phys. Lett., 72, 1394 (1998).
M.E. Lines and A.M. Glass, Principles and Applications of Ferroelectrics and Related Materials (Clarendon Press, Oxford, 1977), pp. 94–96.
Y.G. Wang, W.L. Zhong, and P.L. Zhang, Phys. Rev., B51, 5311 (1995).
D. Schwenk, F. Fishman, and F. Schwabl, Phys. Rev., B38, 11618 (1988); J. Phys.: Condens. Matter, 2, 5409 (1990).
U.T. Hochli and L.A. Boatner, Phys Rev., B20, 266 (1979).
B.D. Qu, W.L. Zhong, and P.L. Zhang, Phys. Lett., A189, 419 (1994); Jpn. J. Appl. Phys., 34, 4114 (1995).
D. Rytz and H.J. Scheel, J. Cryst. Growth, 59, 468 (1982).
I.N. Zakharchenko, E.S. Nikitin, V.M. Mukhortov, Yu.I. Golovko, M.G. Radchenko, and V.P. Dukdevich, Phys. Stat. sol.(a), 114, 559 (1989).
S. Hoon Oh and Hyun M. Jang, Appl. Phys. Lett., 72, 1457 (1999).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Christen, HM., Harshavardhan, K., Chisholm, M. et al. The Effect of Size, Strain, and Long-Range Interactions on Ferroelectric Phase Transitions in KNbO3KTaO3KNbO3 Superlattices Studied by X-ray, EXAFS, and Dielectric Measurements. Journal of Electroceramics 4, 279–287 (2000). https://doi.org/10.1023/A:1009994004989
Issue Date:
DOI: https://doi.org/10.1023/A:1009994004989