Abstract
A brief review of the origins of bipolar leakage currents, the means used for its measurement and calculation and the importance of minimizing the phenomenon, is followed by a novel means of computing leakage currents more accurately than hitherto possible, using a commercially available simulation program. This has the further advantage that the reali-V characteristics of an electrochemical cell can be used, there being no need to represent the cell itself as a zener diode which is a poor representation of reali-V cell characteristics.
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Kuhn, A.T., Booth, J.S. Electrical leakage currents in bipolar cell stacks. J Appl Electrochem 10, 233–237 (1980). https://doi.org/10.1007/BF00726091
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DOI: https://doi.org/10.1007/BF00726091