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Charged-particle induced background expected in X-ray detecting CCDs in highly eccentric earth orbits

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Abstract

Charged particle fluxes on satellites in highly eccentric Earth orbits are studied, using data from ISEE1 and EXOSAT missions. The effects of minimum-ionizing particles, low-energy electrons and secondary radiation produced by these particles on CCDs used as X-ray detectors are identified. A technique to discriminate events caused by minimum-ionizing particles from X-ray events is proposed. The need for a deflecting system against low-energy electrons with focusing X-ray optics is demonstrated. An expected secondary radiation spectrum behind a typical detector shielding based on Monte-Carlo-simulations is presented. For the EPIC detectors on XMM, detection rates due to this radiation environment are estimated.

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  1. Max-Planck-Institute for Extraterrestrial Physicsg, Giessenbachstraße, 85748, Garching, Germany

    R. Danner

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  1. R. Danner
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Danner, R. Charged-particle induced background expected in X-ray detecting CCDs in highly eccentric earth orbits. Exp Astron 4, 105–116 (1993). https://doi.org/10.1007/BF01588348

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  • DOI: https://doi.org/10.1007/BF01588348

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