Abstract
A new technique for the economical evaluation of transverse muon spin relaxation functions in situations involving μ+ trapping at and detrapping from crystal defects is applied to electron-irradiated Ta exhibiting relaxation maxima at about 35 K, 100 K, and 250 K. The longrange μ+ diffusion is shown to be limited by traps over the entire temperature range investigated. The (static) relaxation rates for several possible configurations of trapped muons are discussed, including the effect of the simultaneous presence of a proton in a vacancy.
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Work supported by the Bundesministerium für Forschung und Technologie, Bonn, Fed. Rep. of Germany
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Döring, K.P., Arnold, K.P., Aurenz, T. et al. Computation of transverse muon-spin relaxation functions including trapping-detrapping reactions, with application to electron-irradiated tantalum. Hyperfine Interact 31, 163–168 (1986). https://doi.org/10.1007/BF02401555
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DOI: https://doi.org/10.1007/BF02401555