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Surface electromigration of Au-Ag binary film on SiO2

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Journal of Materials Science Letters

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References

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Authors and Affiliations

  1. Department of Chemistry, Tsinghua University, Beijing, 100084, People's Republic of China

    F. X. Shi, W. Q. Yao & L. L. Cao

  2. Institute of Physics, Chinese Academy of Sciences, Beijing, 100080, People's Republic of China

    Y. H. Dong

Authors
  1. F. X. Shi
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  2. W. Q. Yao
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  3. L. L. Cao
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  4. Y. H. Dong
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Shi, F.X., Yao, W.Q., Cao, L.L. et al. Surface electromigration of Au-Ag binary film on SiO2. Journal of Materials Science Letters 16, 1205–1207 (1997). https://doi.org/10.1023/A:1018577514300

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  • DOI: https://doi.org/10.1023/A:1018577514300

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