Skip to main content
SpringerLink
Log in

Effect of grain boundary scattering on the TCR of thin tin films

  • Published:
Journal of Materials Science Letters

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

References

  1. C. R. TELLIER and A. J. TOSSER, “Size Effects in Thin Films” (Elsevier, Amsterdam, 1982) Chap. 1, Sect. 3.2.

    Google Scholar 

  2. A. F. MAYADAS and M. SHATZKES,Phys. Rev. B 1 (1970) 1382.

    Google Scholar 

  3. C. R. PICHARD, A. J. TOSSER, C. R. TELLIER and K. C. BARUA,J. Mater. Sci. 16 (1981) 2480.

    Google Scholar 

  4. C. R. PICHARD, A. J. TOSSER and C. R. TELLIER, ibid.16 (1981) 451.

    Google Scholar 

  5. C. R. PICHARD, C. R. TELLIER and A. J. TOSSER,Le Vide, Les Couches Minces 203 (1980) 207.

    Google Scholar 

  6. C. R. TELLIER and A. J. TOSSER, “Size Effects in Thin Films” (Elsevier, Amsterdam, 1982) Chap. 1, Sect. 3.3. and 3.4.

    Google Scholar 

  7. B. I. BELEVTSEV, Y. F. KOMNIK, V. E. KOPINA and L. A. YATSUK,Sov. J. Low Temp. Phys. 6 (1980) 365.

    Google Scholar 

  8. C. R. TELLIER and A. J. TOSSER,Thin Solid Films 70 (1980) 225.

    Google Scholar 

  9. C. R. PICHARD, C. R. TELLIER and A. J. TOSSER, ibid.62 (1979) 189.

    Google Scholar 

  10. E. H. SONDHEIMER,Adv. Phys. 1 (1952) 1.

    Google Scholar 

  11. C. R. TELLIER, C. R. PICHARD and A. J. TOSSER,Thin Solid Films 61 (1979) 349.

    Google Scholar 

  12. Idem, Electrocomp. Sci. Technol. 9 (1981) 125.

    Google Scholar 

  13. C. R. PICHARD, C. R. TELLIER, L. OUARBYA and A. J. TOSSER,Le Vide, Les Couches Minces 210 (1982) 3.

    Google Scholar 

  14. K. L. CHOPRA, “Thin Film Phenomena” (McGraw Hill, New York, 1969) Chap. VI.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Laboratoire d'Electronique, Universitè de Nancy 1, BP 239, 54506, Vandoeuvre-les-Nancy, France

    C. R. Pichard

  2. Physicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov, Ukrainian SSR

    Yu. F. Komnik & B. I. Belevtsev

  3. Laboratoire d'Electronique, Universitè de Nancy 1, BP 239, 54506, Vandoeuvre-les-Nancy, France

    A. J. Tosser

Authors
  1. C. R. Pichard
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Yu. F. Komnik
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. B. I. Belevtsev
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. A. J. Tosser
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Pichard, C.R., Komnik, Y.F., Belevtsev, B.I. et al. Effect of grain boundary scattering on the TCR of thin tin films. J Mater Sci Lett 2, 360–362 (1983). https://doi.org/10.1007/BF00726330

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00726330

Keywords

Search

Navigation