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Independence of the scattering process at the surface of thin metal film in the framework of the multidimensional conduction models

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Journal of Materials Science Letters

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References

  1. C. R. TELLIER and A. J. TOSSER, “Size Effects in Thin Films”, (Elsevier, Amsterdam, New York, 1982) Ch. 1.

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Authors and Affiliations

  1. Laboratoire d'Electronique, Université de Nancy 1, B.P. 239, 54506, Vandoeuvre-les-Nancy Cedex, France

    H. Tijani, C. R. Pichard & A. J. Tosser

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  1. H. Tijani
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  2. C. R. Pichard
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  3. A. J. Tosser
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Tijani, H., Pichard, C.R. & Tosser, A.J. Independence of the scattering process at the surface of thin metal film in the framework of the multidimensional conduction models. J Mater Sci Lett 6, 555–558 (1987). https://doi.org/10.1007/BF01739282

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  • DOI: https://doi.org/10.1007/BF01739282

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