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Particle Induced X-Ray Emission (PIXE) Analysis of Basella Alba L Leaves

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Abstract

Six groups of Basella Alba L plants grown in different conditions were analysed by using particle induced X-ray emission (PIXE) method to establish a relationship between the elemental map and growth fertiliser conditions. The target samples were bombarded with a 3 MeV protons beam at the tandem accelerator of IFIN-HH Bucharest and the X-rays were detected with a HPGe detector with a 160 eV resolution at the 6.4 keV of Kα line of iron. The concentrations obtained have an estimated error of less then 6% for most of the elements analysed.

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Authors and Affiliations

  1. Physics Department, Valahia University of Targoviste, Targoviste, Romania

    C. Stihi, I. V. Popescu, G. Busuioc & G. Dima

  2. National Institute for Nuclear Physics and Engineering, Bucharest, Romania

    T. Badica & A. Olariu

Authors
  1. C. Stihi
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  2. I. V. Popescu
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  3. G. Busuioc
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  4. T. Badica
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  5. A. Olariu
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  6. G. Dima
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Stihi, C., Popescu, I.V., Busuioc, G. et al. Particle Induced X-Ray Emission (PIXE) Analysis of Basella Alba L Leaves. Journal of Radioanalytical and Nuclear Chemistry 246, 445–447 (2000). https://doi.org/10.1023/A:1006796523789

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  • DOI: https://doi.org/10.1023/A:1006796523789

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