Abstract
Six groups of Basella Alba L plants grown in different conditions were analysed by using particle induced X-ray emission (PIXE) method to establish a relationship between the elemental map and growth fertiliser conditions. The target samples were bombarded with a 3 MeV protons beam at the tandem accelerator of IFIN-HH Bucharest and the X-rays were detected with a HPGe detector with a 160 eV resolution at the 6.4 keV of Kα line of iron. The concentrations obtained have an estimated error of less then 6% for most of the elements analysed.
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Stihi, C., Popescu, I.V., Busuioc, G. et al. Particle Induced X-Ray Emission (PIXE) Analysis of Basella Alba L Leaves. Journal of Radioanalytical and Nuclear Chemistry 246, 445–447 (2000). https://doi.org/10.1023/A:1006796523789
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DOI: https://doi.org/10.1023/A:1006796523789