Summary
We have studied the effects of 235 MeV197Au ion implantation on critical current density, creep rate and irreversibility line of YBCO melt-textured bulk samples. The fluence was 1.25·1011 ions/cm2, corresponding to a dose equivalent field of 2.5 T. We created two surface layers with correlated defects on the opposite sides of the sample, in such a way that the irradiated part was about 13% of the total volume. Such a surface irradiation caused a quite large widening of the irreversibility region in theB-T phase diagram. Critical current enhancements —having different behaviours as a function of field in different temperature ranges and reaching more pronounced values at higher temperatures and fields—were found.
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Mezzetti, E., Cherubini, R., Gerbaldo, R. et al. Enhanced vortex pinning in melt-textured YBCO by means of gold-ion-induced defects. Il Nuovo Cimento D 18, 1099–1103 (1996). https://doi.org/10.1007/BF02457675
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DOI: https://doi.org/10.1007/BF02457675